Abstract: The electron beam inspection methodology for voltage contrast (VC) defects has been widely adopted in the early stages of sub-10nm logic and memory technology development, as well as in new ...
A new technical paper titled “Advances in You Only Look Once (YOLO) algorithms for lane and object detection in autonomous vehicles” was published by RMIT University, Kyungpook National University, ...
Scientists at Tarim University of China have proposed a way to address the challenging problem of pose recognition for photovoltaic panel cleaning robots. Their novel solution is based on a low power ...
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