Semiconductor Engineering

Full-Chip Voltage Contrast Inference Using Deep Learning; You Only Look Once: Voltage Contrast (YOLO-VC)

Abstract: The electron beam inspection methodology for voltage contrast (VC) defects has been widely adopted in the early stages of sub-10nm logic and memory technology development, as well as in new ...
Semiconductor Engineering

Autonomous Driving: Assessment Of YOLO Algorithms (RMIT et al.)

A new technical paper titled “Advances in You Only Look Once (YOLO) algorithms for lane and object detection in autonomous vehicles” was published by RMIT University, Kyungpook National University, ...